توضیحات
اطلاعات کتاب:
| نویسنده: Ricardo Reis , Yu Cao , Gilson Wirth | ISBN-10: 1461440777 |
| ناشر: Springer | ISBN-13: 978-1461440772 |
| ویرایش: ویرایش 2015 | تاریخ انتشار: November 8, 2014 |
| تعداد صفحات: 272 | رتبه فروش در سایت آمازون: #1341 در دسته ی Quality Control |
| فرمت کتاب: PDF | #1504 در دسته ی Design |
| کیفیت صفحات: اصلی | #2960 در دسته ی CAD |
خلاصه ای از کتاب:
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
- Provides comprehensive review on various reliability mechanisms at sub-45nm nodes;
- Describes practical modeling and characterization techniques for reliability;
- Includes thorough presentation of robust design techniques for major VLSI design units;
- Promotes physical understanding with first-principle simulations.
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